X-Ray Fluorescence


Rigaku NEX CG delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — with minimal standards:

  • Analyze 11Na to 92U non-destructively
  • Solids, liquids, powders and thin films
  • Polarized excitation for lower detection limits
  • Novel treatment of peak overlap reduces errors
  • PPB detection limits for aqueous samples using UltraCarry
  • Simplified user interface with EZ Analysis

Polarized cartesian geometry for trace level sensitivity

Unlike conventional EDXRF analyzers, the NEX CG was engineered with a unique close-coupled Cartesian Geometry (CG) optical kernel that dramatically increases signal-to-noise. By using secondary target excitation, instead of convention direct excitation, sensitivity is further improved. The resulting dramatic reduction in background noise, and simultaneous increase in element peaks, result in a spectrometer capable of routine trace element analysis even in difficult sample types.

Novel software reduces the need for standards


NEX CG is powered by a new qualitative and quantitative analytical software, RPF-SQX, that features Rigaku Profile Fitting (RPF) technology. The software allows semi-quantitative analysis of almost all sample types without standards — and rigorous quantitative analysis with standards



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As a premium low cost benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyser, the Rigaku NEX QC delivers wide elemental coverage with an easy-to-learn software interface in a robust package designed for industrial at-line quality control applications. Non-destructively analyse from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries.


EDXRF optimized for quality control applications

Specifically designed for routine quality control elemental analysis applications, the new Rigaku NEX QC features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.

EDXRF with broad elemental coverage

The shuttered 50kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

NEX QC options: autosampler, helium and FP

Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity. For those applications requiring higher resolution and sensitivity, Rigaku offers the new NEX QC+ energy dispersive X-ray fluorescence analyser which is equipped with a silicon drift detector (SDD).


·         Analyse 11Na to 92U non-destructively

·         Solids, liquids, alloys, powders and thin films

·         50kV X-ray tube for wide elemental coverage

·         Semiconductor detector for superior data quality

·         Modern smartphone style "icon driven" user interface

·         Multiple automated tube filters for enhanced sensitivity

·         Convenient built in thermal printer

·         Low cost with unmatched performance-to-price ratio


·         Optional fundamental parameters